Advanced Verification Techniques: A SystemC Based Approach for Successful Tapeout

• Κύριοι συγγραφείς: Singh, Leena (Συγγραφέας), Drucker, Leonard (Συγγραφέας), Khan, Neyaz (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Boston, MA : Springer US, 2004.
• Θέματα: Engineering.; Computer-aided engineering.; Electrical engineering.; Electronic circuits.; Circuits and Systems.; Electrical Engineering.; Computer-Aided Engineering (CAD, CAE) and Design.

"As chip size and complexity continues to grow exponentially, the challenges of functional verification are becoming a critical issue in the electronics industry. It is now commonly heard that logical errors missed during functional verification are the most common cause of chip re-spins, and t...