Advanced Verification Techniques: A SystemC Based Approach for Successful Tapeout

Advanced Verification Techniques: A SystemC Based Approach for Successful Tapeout

"As chip size and complexity continues to grow exponentially, the challenges of functional verification are becoming a critical issue in the electronics industry. It is now commonly heard that logical errors missed during functional verification are the most common cause of chip re-spins, and t...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς:	Singh, Leena (Συγγραφέας), Drucker, Leonard (Συγγραφέας), Khan, Neyaz (Συγγραφέας)
Συγγραφή απο Οργανισμό/Αρχή:	SpringerLink (Online service)
Μορφή:	Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:	English
Έκδοση:	Boston, MA : Springer US, 2004.
Θέματα:	Engineering. Computer-aided engineering. Electrical engineering. Electronic circuits. Circuits and Systems. Electrical Engineering. Computer-Aided Engineering (CAD, CAE) and Design.
Διαθέσιμο Online:	Full Text via HEAL-Link

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