Advanced Verification Techniques: A SystemC Based Approach for Successful Tapeout

"As chip size and complexity continues to grow exponentially, the challenges of functional verification are becoming a critical issue in the electronics industry. It is now commonly heard that logical errors missed during functional verification are the most common cause of chip re-spins, and t...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς: Singh, Leena (Συγγραφέας), Drucker, Leonard (Συγγραφέας), Khan, Neyaz (Συγγραφέας)
Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Boston, MA : Springer US, 2004.
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
Πίνακας περιεχομένων:
  • Verification Process
  • Using SCV for Verification
  • Functional Verification Testplan
  • Testbench Concepts using SystemC
  • Verification Methodology
  • Regression/Setup and Run
  • Functional Coverage
  • Dynamic Memory Modeling
  • Post Synthesis Gate Simulation.