Power-Aware Testing and Test Strategies for Low Power Devices

Power-Aware Testing and Test Strategies for Low Power Devices

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Power-Aware Testing and Test Strategies for Low-Power Devices Edited by: Patrick Girard, Research Director, CNRS / LIRMM, France Nicola Nicolici, Associate Professor, McMaster University, Canada Xiaoqing Wen, Professor, Kyushu Institute of Technology, Japan Managing the power consumption of circuits...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Συγγραφή απο Οργανισμό/Αρχή:	SpringerLink (Online service)
Άλλοι συγγραφείς:	Girard, Patrick (Επιμελητής έκδοσης), Nicolici, Nicola (Επιμελητής έκδοσης), Wen, Xiaoqing (Επιμελητής έκδοσης)
Μορφή:	Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:	English
Έκδοση:	Boston, MA : Springer US, 2010.
Θέματα:	Engineering. Computer-aided engineering. Electronic circuits. Circuits and Systems. Computer-Aided Engineering (CAD, CAE) and Design.
Διαθέσιμο Online:	Full Text via HEAL-Link

Παρόμοια τεκμήρια

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