Power-Aware Testing and Test Strategies for Low Power Devices

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Girard, Patrick (Επιμελητής έκδοσης), Nicolici, Nicola (Επιμελητής έκδοσης), Wen, Xiaoqing (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Boston, MA : Springer US, 2010.
• Θέματα: Engineering.; Computer-aided engineering.; Electronic circuits.; Circuits and Systems.; Computer-Aided Engineering (CAD, CAE) and Design.

Power-Aware Testing and Test Strategies for Low-Power Devices Edited by: Patrick Girard, Research Director, CNRS / LIRMM, France Nicola Nicolici, Associate Professor, McMaster University, Canada Xiaoqing Wen, Professor, Kyushu Institute of Technology, Japan Managing the power consumption of circuits...

Πίνακας περιεχομένων:

• Fundamentals of VLSI Testing
• Power Issues During Test
• Low-Power Test Pattern Generation
• Power-Aware Design-for-Test
• Power-Aware Test Data Compression and BIST
• Power-Aware System-Level Test Planning
• Low-Power Design Techniques and Test Implications
• Test Strategies for Multivoltage Designs
• Test Strategies for Gated Clock Designs
• Test of Power Management Structures
• EDA Solution for Power-Aware Design-for-Test.