Power-Aware Testing and Test Strategies for Low Power Devices

• Corporate Author: SpringerLink (Online service)
• Other Authors: Girard, Patrick (Editor), Nicolici, Nicola (Editor), Wen, Xiaoqing (Editor)
• Format: Electronic eBook
• Language: English
• Published: Boston, MA : Springer US, 2010.
• Subjects: Engineering.; Computer-aided engineering.; Electronic circuits.; Circuits and Systems.; Computer-Aided Engineering (CAD, CAE) and Design.

Power-Aware Testing and Test Strategies for Low-Power Devices Edited by: Patrick Girard, Research Director, CNRS / LIRMM, France Nicola Nicolici, Associate Professor, McMaster University, Canada Xiaoqing Wen, Professor, Kyushu Institute of Technology, Japan Managing the power consumption of circuits...

Table of Contents:

• Fundamentals of VLSI Testing
• Power Issues During Test
• Low-Power Test Pattern Generation
• Power-Aware Design-for-Test
• Power-Aware Test Data Compression and BIST
• Power-Aware System-Level Test Planning
• Low-Power Design Techniques and Test Implications
• Test Strategies for Multivoltage Designs
• Test Strategies for Gated Clock Designs
• Test of Power Management Structures
• EDA Solution for Power-Aware Design-for-Test.