Power-Aware Testing and Test Strategies for Low Power Devices

Power-Aware Testing and Test Strategies for Low-Power Devices Edited by: Patrick Girard, Research Director, CNRS / LIRMM, France Nicola Nicolici, Associate Professor, McMaster University, Canada Xiaoqing Wen, Professor, Kyushu Institute of Technology, Japan Managing the power consumption of circuits...

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Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Girard, Patrick (Editor), Nicolici, Nicola (Editor), Wen, Xiaoqing (Editor)
Format: Electronic eBook
Language:English
Published: Boston, MA : Springer US, 2010.
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ΒΚΠ - Πατρα: ALFd

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Call Number: 330.01 BAU
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