Process Variations and Probabilistic Integrated Circuit Design

• Corporate Author: SpringerLink (Online service)
• Other Authors: Dietrich, Manfred (Editor), Haase, Joachim (Editor)
• Format: Electronic eBook
• Language: English
• Published: New York, NY : Springer New York, 2012.
• Subjects: Engineering.; Computer-aided engineering.; Electronic circuits.; Circuits and Systems.; Computer-Aided Engineering (CAD, CAE) and Design.

Uncertainty in key parameters within a chip and between different chips in the deep sub micron era plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process.  Quantitative methodology is needed to ensure faultless functionality,...