Process Variations and Probabilistic Integrated Circuit Design

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Dietrich, Manfred (Επιμελητής έκδοσης), Haase, Joachim (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: New York, NY : Springer New York, 2012.
• Θέματα: Engineering.; Computer-aided engineering.; Electronic circuits.; Circuits and Systems.; Computer-Aided Engineering (CAD, CAE) and Design.

Uncertainty in key parameters within a chip and between different chips in the deep sub micron era plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process.  Quantitative methodology is needed to ensure faultless functionality,...

Πίνακας περιεχομένων:

• Introduction
• Physical and Mathematical Fundamentals
• Examination of Process Parameter Variations
• Methods of Parameter Variations
• Consequences for Circuits Design and Case Studies
• Conclusion.