Scanning Probe Microscopy of Functional Materials Nanoscale Imaging and Spectroscopy /

• Corporate Author: SpringerLink (Online service)
• Other Authors: Kalinin, Sergei V. (Editor), Gruverman, Alexei (Editor)
• Format: Electronic eBook
• Language: English
• Published: New York, NY : Springer New York, 2011.
• Subjects: Materials science.; Materials Science.; Characterization and Evaluation of Materials.

Novel scanning probe microscopy (SPM) techniques are used for the characterization of local materials functionalities ranging from chemical reactivity and composition to mechanical, electromechanical, and transport behaviors. In this comprehensive overview, special emphasis is placed on emerging app...