Scanning Probe Microscopy of Functional Materials Nanoscale Imaging and Spectroscopy /

Scanning Probe Microscopy of Functional Materials Nanoscale Imaging and Spectroscopy /

Novel scanning probe microscopy (SPM) techniques are used for the characterization of local materials functionalities ranging from chemical reactivity and composition to mechanical, electromechanical, and transport behaviors. In this comprehensive overview, special emphasis is placed on emerging app...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Συγγραφή απο Οργανισμό/Αρχή:	SpringerLink (Online service)
Άλλοι συγγραφείς:	Kalinin, Sergei V. (Επιμελητής έκδοσης), Gruverman, Alexei (Επιμελητής έκδοσης)
Μορφή:	Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:	English
Έκδοση:	New York, NY : Springer New York, 2011.
Θέματα:	Materials science. Materials Science. Characterization and Evaluation of Materials.
Διαθέσιμο Online:	Full Text via HEAL-Link

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