Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces

• Κύριος συγγραφέας: Walkosz, Weronika (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: New York, NY : Springer New York, 2011.
• Σειρά: Springer Theses
• Θέματα: Materials science.; Biotechnology.; Physical chemistry.; Atomic structure.; Molecular structure.; Spectra.; Spectroscopy.; Microscopy.; Structural materials.; Materials Science.; Ceramics, Glass, Composites, Natural Methods.; Spectroscopy and Microscopy.; Physical Chemistry.; Structural Materials.; Atomic/Molecular Structure and Spectra.; Microengineering.

This thesis presents results from a combined atomic-resolution Z-contrast and annular bright-field imaging and electron energy loss spectroscopy in the Scanning Transmission Electron Microscopy, as well as first principles studies of the interfaces between crystalline β−Si3N4 and amorphous (i) CeO2-...