APA (7th ed.) Citation

Walkosz, W. (2011). Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces. Springer New York.

Chicago Style (17th ed.) Citation

Walkosz, Weronika. Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces. New York, NY: Springer New York, 2011.

MLA (8th ed.) Citation

Walkosz, Weronika. Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces. Springer New York, 2011.