Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces
This thesis presents results from a combined atomic-resolution Z-contrast and annular bright-field imaging and electron energy loss spectroscopy in the Scanning Transmission Electron Microscopy, as well as first principles studies of the interfaces between crystalline β−Si3N4 and amorphous (i) CeO2-...
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| Format: | Electronic eBook |
| Language: | English |
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New York, NY :
Springer New York,
2011.
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| Series: | Springer Theses
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| Online Access: | Full Text via HEAL-Link |
Internet
Full Text via HEAL-LinkΒΚΠ - Πατρα: ALFd
| Call Number: |
330.01 BAU |
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| Copy 1 | Available |
ΒΚΠ - Πατρα: BSC
| Call Number: |
330.01 BAU |
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| Copy 2 | Available |
| Copy 3 | Available |