Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces
This thesis presents results from a combined atomic-resolution Z-contrast and annular bright-field imaging and electron energy loss spectroscopy in the Scanning Transmission Electron Microscopy, as well as first principles studies of the interfaces between crystalline β−Si3N4 and amorphous (i) CeO2-...
| Main Author: | Walkosz, Weronika (Author) |
|---|---|
| Corporate Author: | SpringerLink (Online service) |
| Format: | Electronic eBook |
| Language: | English |
| Published: |
New York, NY :
Springer New York,
2011.
|
| Series: | Springer Theses
|
| Subjects: | |
| Online Access: | Full Text via HEAL-Link |
Similar Items
-
Single-Molecule Metal-Induced Energy Transfer From Basics to Applications /
by: Karedla, Narain
Published: (2017) -
Far- and Deep-Ultraviolet Spectroscopy
Published: (2015) -
Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents /
by: Foster, Adam, et al.
Published: (2006) -
Atomic Force Microscopy/Scanning Tunneling Microscopy 3
Published: (2002) -
NMR-MRI, μSR and Mössbauer Spectroscopies in Molecular Magnets
by: Carretta, Pietro, et al.
Published: (2007)