Built-in-Self-Test and Digital Self-Calibration for RF SoCs

• Κύριοι συγγραφείς: Bou-Sleiman, Sleiman (Συγγραφέας), Ismail, Mohammed (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: New York, NY : Springer New York, 2012.
• Σειρά: SpringerBriefs in Electrical and Computer Engineering
• Θέματα: Engineering.; Electronic circuits.; Circuits and Systems.; Signal, Image and Speech Processing.; Electronic Circuits and Devices.

This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computin...