Built-in-Self-Test and Digital Self-Calibration for RF SoCs

• Κύριοι συγγραφείς: Bou-Sleiman, Sleiman (Συγγραφέας), Ismail, Mohammed (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: New York, NY : Springer New York, 2012.
• Σειρά: SpringerBriefs in Electrical and Computer Engineering
• Θέματα: Engineering.; Electronic circuits.; Circuits and Systems.; Signal, Image and Speech Processing.; Electronic Circuits and Devices.
• Φυσική περιγραφή: XVII, 89 p. 70 illus. online resource.
• ISBN: 9781441995483

This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume. .