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02401nam a22004695i 4500 |
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978-1-4419-9548-3 |
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DE-He213 |
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20151204144204.0 |
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cr nn 008mamaa |
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110922s2012 xxu| s |||| 0|eng d |
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|a 9781441995483
|9 978-1-4419-9548-3
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|a 10.1007/978-1-4419-9548-3
|2 doi
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|d GrThAP
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|a TK7888.4
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|a TJFC
|2 bicssc
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|a 621.3815
|2 23
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|a Bou-Sleiman, Sleiman.
|e author.
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|a Built-in-Self-Test and Digital Self-Calibration for RF SoCs
|h [electronic resource] /
|c by Sleiman Bou-Sleiman, Mohammed Ismail.
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|a New York, NY :
|b Springer New York,
|c 2012.
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| 300 |
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|a XVII, 89 p. 70 illus.
|b online resource.
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|a text
|b txt
|2 rdacontent
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|a computer
|b c
|2 rdamedia
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|a online resource
|b cr
|2 rdacarrier
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|a text file
|b PDF
|2 rda
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|a SpringerBriefs in Electrical and Computer Engineering
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|a Introduction and Motivation -- Radio Systems Overview: Architecture, Performance and Built-in-Test -- Efficient Testing for RF SoCs -- RF Built-in-Self-Test -- RF Built-in-Self-Calibration -- Conclusions.
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|a This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume. .
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|a Engineering.
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|a Electronic circuits.
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|a Engineering.
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|a Circuits and Systems.
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|a Signal, Image and Speech Processing.
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|a Electronic Circuits and Devices.
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|a Ismail, Mohammed.
|e author.
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|a SpringerLink (Online service)
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|t Springer eBooks
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|i Printed edition:
|z 9781441995476
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| 830 |
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|a SpringerBriefs in Electrical and Computer Engineering
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|u http://dx.doi.org/10.1007/978-1-4419-9548-3
|z Full Text via HEAL-Link
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|a ZDB-2-ENG
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| 950 |
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|a Engineering (Springer-11647)
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