Built-in-Self-Test and Digital Self-Calibration for RF SoCs

• Main Authors: Bou-Sleiman, Sleiman (Author), Ismail, Mohammed (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic eBook
• Language: English
• Published: New York, NY : Springer New York, 2012.
• Series: SpringerBriefs in Electrical and Computer Engineering
• Subjects: Engineering.; Electronic circuits.; Circuits and Systems.; Signal, Image and Speech Processing.; Electronic Circuits and Devices.

This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computin...