Built-in-Self-Test and Digital Self-Calibration for RF SoCs
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computin...
| Main Authors: | , |
|---|---|
| Corporate Author: | |
| Format: | Electronic eBook |
| Language: | English |
| Published: |
New York, NY :
Springer New York,
2012.
|
| Series: | SpringerBriefs in Electrical and Computer Engineering
|
| Subjects: | |
| Online Access: | Full Text via HEAL-Link |
