Electron Energy-Loss Spectroscopy in the Electron Microscope

• Κύριος συγγραφέας: Egerton, R.F (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Boston, MA : Springer US, 2011.
• Θέματα: Materials science.; Spectroscopy.; Solid state physics.; Microscopy.; Nanotechnology.; Materials Science.; Characterization and Evaluation of Materials.; Spectroscopy/Spectrometry.; Spectroscopy and Microscopy.; Solid State Physics.

Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level.  In two previous editions, Electron Energy-Loss Spectroscopy in the Elec...