Modeling Nanoscale Imaging in Electron Microscopy

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Vogt, Thomas (Επιμελητής έκδοσης), Dahmen, Wolfgang (Επιμελητής έκδοσης), Binev, Peter (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Boston, MA : Springer US, 2012.
• Σειρά: Nanostructure Science and Technology,
• Θέματα: Materials science.; Analytical chemistry.; Chemistry, Physical and theoretical.; Physical measurements.; Measurement.; Nanotechnology.; Materials Science.; Characterization and Evaluation of Materials.; Analytical Chemistry.; Theoretical and Computational Chemistry.; Measurement Science and Instrumentation.

Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission...