Modeling Nanoscale Imaging in Electron Microscopy

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Vogt, Thomas (Επιμελητής έκδοσης), Dahmen, Wolfgang (Επιμελητής έκδοσης), Binev, Peter (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Boston, MA : Springer US, 2012.
• Σειρά: Nanostructure Science and Technology,
• Θέματα: Materials science.; Analytical chemistry.; Chemistry, Physical and theoretical.; Physical measurements.; Measurement.; Nanotechnology.; Materials Science.; Characterization and Evaluation of Materials.; Analytical Chemistry.; Theoretical and Computational Chemistry.; Measurement Science and Instrumentation.
• Φυσική περιγραφή: IX, 182 p. online resource.
• ISBN: 9781461421917
• ISSN: 1571-5744

Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.