Modeling Nanoscale Imaging in Electron Microscopy

• Corporate Author: SpringerLink (Online service)
• Other Authors: Vogt, Thomas (Editor), Dahmen, Wolfgang (Editor), Binev, Peter (Editor)
• Format: Electronic eBook
• Language: English
• Published: Boston, MA : Springer US, 2012.
• Series: Nanostructure Science and Technology,
• Subjects: Materials science.; Analytical chemistry.; Chemistry, Physical and theoretical.; Physical measurements.; Measurement.; Nanotechnology.; Materials Science.; Characterization and Evaluation of Materials.; Analytical Chemistry.; Theoretical and Computational Chemistry.; Measurement Science and Instrumentation.

Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission...