Helium Ion Microscopy Principles and Applications /
Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions – such as the Helium Ion Microscope (HIM) – are destined to become the imaging tools of choice for the 21st century. Topics covered includ...
Main Author: | Joy, David C. (Author) |
---|---|
Corporate Author: | SpringerLink (Online service) |
Format: | Electronic eBook |
Language: | English |
Published: |
New York, NY :
Springer New York : Imprint: Springer,
2013.
|
Series: | SpringerBriefs in Materials,
|
Subjects: | |
Online Access: | Full Text via HEAL-Link |
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