Helium Ion Microscopy Principles and Applications /

Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions – such as the Helium Ion Microscope (HIM) – are destined to become the imaging tools of choice for the 21st century. Topics covered includ...

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Bibliographic Details
Main Author: Joy, David C. (Author)
Corporate Author: SpringerLink (Online service)
Format: Electronic eBook
Language:English
Published: New York, NY : Springer New York : Imprint: Springer, 2013.
Series:SpringerBriefs in Materials,
Subjects:
Online Access:Full Text via HEAL-Link

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