Practical Materials Characterization

This unique book covers the most common materials analysis techniques, such as transmission electron microscopy, x-ray diffraction and reflectivity, auger electron spectroscopy, secondary ion mass spectrometry, photoelectron spectroscopy, and several optical characterization methods. It stands as a...

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Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Sardela, Mauro (Editor)
Format: Electronic eBook
Language:English
Published: New York, NY : Springer New York : Imprint: Springer, 2014.
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ΒΚΠ - Πατρα: ALFd

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Call Number: 330.01 BAU
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ΒΚΠ - Πατρα: BSC

Holdings details from ΒΚΠ - Πατρα: BSC
Call Number: 330.01 BAU
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