Goldstein, J. I., Newbury, D. E., Michael, J. R., Ritchie, N. W., Scott, J. H. J., & Joy, D. C. (2018). Scanning Electron Microscopy and X-Ray Microanalysis (4th ed. 2018.). Springer New York : Imprint: Springer. https://doi.org/10.1007/978-1-4939-6676-9
Παραπομπή σε μορφή Chicago (17η εκδ.)Goldstein, Joseph I., Dale E. Newbury, Joseph R. Michael, Nicholas W.M Ritchie, John Henry J. Scott, και David C. Joy. Scanning Electron Microscopy and X-Ray Microanalysis. 4th ed. 2018. New York, NY: Springer New York : Imprint: Springer, 2018. https://doi.org/10.1007/978-1-4939-6676-9.
Παραπομπή σε μορφή MLA (8th εκδ.)Goldstein, Joseph I., et al. Scanning Electron Microscopy and X-Ray Microanalysis. 4th ed. 2018. Springer New York : Imprint: Springer, 2018. https://doi.org/10.1007/978-1-4939-6676-9.
