Scanning Electron Microscopy and X-Ray Microanalysis

• Κύριοι συγγραφείς: Goldstein, Joseph I. (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut), Newbury, Dale E. (http://id.loc.gov/vocabulary/relators/aut), Michael, Joseph R. (http://id.loc.gov/vocabulary/relators/aut), Ritchie, Nicholas W.M (http://id.loc.gov/vocabulary/relators/aut), Scott, John Henry J. (http://id.loc.gov/vocabulary/relators/aut), Joy, David C. (http://id.loc.gov/vocabulary/relators/aut)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: New York, NY : Springer New York : Imprint: Springer, 2018.
• Έκδοση: 4th ed. 2018.
• Θέματα: Materials science.; Spectroscopy.; Microscopy.; Physical measurements.; Measurement .; Characterization and Evaluation of Materials.; Spectroscopy and Microscopy.; Biological Microscopy.; Spectroscopy/Spectrometry.; Measurement Science and Instrumentation.

This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD)...