Integrated Circuit Test Engineering Modern Techniques /
Nearly sixty years ago, the first successful demonstration of the transistor proved to be the herald of a new era of microelectronics. The ever-increasing complexity and functional speed of microelectronic circuits now containing tens of millions of transistors demand appropriate and rigorous test e...
Main Author: | Grout, Ian A. (Author) |
---|---|
Corporate Author: | SpringerLink (Online service) |
Format: | Electronic eBook |
Language: | English |
Published: |
London :
Springer London,
2006.
|
Subjects: | |
Online Access: | Full Text via HEAL-Link |
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