Integrated Circuit Test Engineering Modern Techniques /
Nearly sixty years ago, the first successful demonstration of the transistor proved to be the herald of a new era of microelectronics. The ever-increasing complexity and functional speed of microelectronic circuits now containing tens of millions of transistors demand appropriate and rigorous test e...
Κύριος συγγραφέας: | Grout, Ian A. (Συγγραφέας) |
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Συγγραφή απο Οργανισμό/Αρχή: | SpringerLink (Online service) |
Μορφή: | Ηλεκτρονική πηγή Ηλ. βιβλίο |
Γλώσσα: | English |
Έκδοση: |
London :
Springer London,
2006.
|
Θέματα: | |
Διαθέσιμο Online: | Full Text via HEAL-Link |
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