Integrated Circuit Test Engineering Modern Techniques /

• Κύριος συγγραφέας: Grout, Ian A. (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: London : Springer London, 2006.
• Θέματα: Engineering.; Computer hardware.; Computer system failures.; Industrial engineering.; Production engineering.; Electrical engineering.; Electronics.; Microelectronics.; Electronic circuits.; Circuits and Systems.; Electrical Engineering.; Electronics and Microelectronics, Instrumentation.; Computer Hardware.; System Performance and Evaluation.; Industrial and Production Engineering.

Nearly sixty years ago, the first successful demonstration of the transistor proved to be the herald of a new era of microelectronics. The ever-increasing complexity and functional speed of microelectronic circuits now containing tens of millions of transistors demand appropriate and rigorous test e...

Πίνακας περιεχομένων:

• to Integrated Circuit Test Engineering
• Fabrication Processes for Integrated Circuits
• Digital Logic Test
• Memory Test
• Analogue Test
• Mixed-Signal Test
• Input-Output Test
• Design for Testability — Structured Test Approaches
• System on a Chip (SoC) Test
• Test Pattern Generation and Fault Simulation
• Automatic Test Equipment (ATE) and Production Test
• Test Economics.