Integrated Circuit Test Engineering Modern Techniques /

Nearly sixty years ago, the first successful demonstration of the transistor proved to be the herald of a new era of microelectronics. The ever-increasing complexity and functional speed of microelectronic circuits now containing tens of millions of transistors demand appropriate and rigorous test e...

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Bibliographic Details
Main Author: Grout, Ian A. (Author)
Corporate Author: SpringerLink (Online service)
Format: Electronic eBook
Language:English
Published: London : Springer London, 2006.
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ΒΚΠ - Πατρα: ALFd

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Call Number: 330.01 BAU
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ΒΚΠ - Πατρα: BSC

Holdings details from ΒΚΠ - Πατρα: BSC
Call Number: 330.01 BAU
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