Precision Landmark Location for Machine Vision and Photogrammetry Finding and Achieving the Maximum Possible Accuracy /

• Main Authors: Armstrong, Brian S.R (Author), Gutierrez, José A. (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic eBook
• Language: English
• Published: London : Springer London, 2008.
• Subjects: Computer science.; Radiology.; Image processing.; Remote sensing.; Statistics.; Control engineering.; Robotics.; Mechatronics.; Computer Science.; Image Processing and Computer Vision.; Control, Robotics, Mechatronics.; Remote Sensing/Photogrammetry.; Signal, Image and Speech Processing.; Imaging / Radiology.; Statistics for Engineering, Physics, Computer Science, Chemistry and Earth Sciences.

The applications of image-based measurement are many and various: image-guided surgery, mobile-robot navigation, component alignment, part inspection and photogrammetry, among others. In all these applications, landmarks are detected and located in images, and measurements made from those locations....