Armstrong, B. S., & Gutierrez, J. A. (2008). Precision Landmark Location for Machine Vision and Photogrammetry: Finding and Achieving the Maximum Possible Accuracy. Springer London.
Chicago Style (17th ed.) CitationArmstrong, Brian S.R, and José A. Gutierrez. Precision Landmark Location for Machine Vision and Photogrammetry: Finding and Achieving the Maximum Possible Accuracy. London: Springer London, 2008.
MLA (8th ed.) CitationArmstrong, Brian S.R, and José A. Gutierrez. Precision Landmark Location for Machine Vision and Photogrammetry: Finding and Achieving the Maximum Possible Accuracy. Springer London, 2008.
Warning: These citations may not always be 100% accurate.