Precision Landmark Location for Machine Vision and Photogrammetry Finding and Achieving the Maximum Possible Accuracy /

• Κύριοι συγγραφείς: Armstrong, Brian S.R (Συγγραφέας), Gutierrez, José A. (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: London : Springer London, 2008.
• Θέματα: Computer science.; Radiology.; Image processing.; Remote sensing.; Statistics.; Control engineering.; Robotics.; Mechatronics.; Computer Science.; Image Processing and Computer Vision.; Control, Robotics, Mechatronics.; Remote Sensing/Photogrammetry.; Signal, Image and Speech Processing.; Imaging / Radiology.; Statistics for Engineering, Physics, Computer Science, Chemistry and Earth Sciences.

The applications of image-based measurement are many and various: image-guided surgery, mobile-robot navigation, component alignment, part inspection and photogrammetry, among others. In all these applications, landmarks are detected and located in images, and measurements made from those locations....

Πίνακας περιεχομένων:

• Physics of Digital Image Formation
• Analytic Framework for Landmark Location Uncertainty
• Model-based Landmark Location Estimators
• Two-dimensional Noncollocated Numerical Integration
• Computational Tools
• Experimental Validation
• Studies of Landmark Location Uncertainty
• Conclusions.