Charged Semiconductor Defects Structure, Thermodynamics and Diffusion /

• Main Authors: Seebauer, Edmund G. (Author), Kratzer, Meredith C. (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic eBook
• Language: English
• Published: London : Springer London, 2009.
• Series: Engineering Materials and Processes,
• Subjects: Physics.; Solid state physics.; Spectroscopy.; Microscopy.; Thermodynamics.; Heat engineering.; Heat transfer.; Mass transfer.; Continuum mechanics.; Electronics.; Microelectronics.; Optical materials.; Electronic materials.; Solid State Physics.; Spectroscopy and Microscopy.; Optical and Electronic Materials.; Continuum Mechanics and Mechanics of Materials.; Electronics and Microelectronics, Instrumentation.; Engineering Thermodynamics, Heat and Mass Transfer.

The technologically useful properties of a solid often depend upon the types and concentrations of the defects it contains. Not surprisingly, defects in semiconductors have been studied for many years, in many cases with a view towards controlling their behavior through various forms of "defect...