APA (7th ed.) Citation

SpringerLink (Online service) & Celano, U. (2019). Electrical Atomic Force Microscopy for Nanoelectronics (1st ed. 2019.). Springer International Publishing : Imprint: Springer. https://doi.org/10.1007/978-3-030-15612-1

Chicago Style (17th ed.) Citation

SpringerLink (Online service) and Umberto Celano. Electrical Atomic Force Microscopy for Nanoelectronics. 1st ed. 2019. Cham: Springer International Publishing : Imprint: Springer, 2019. https://doi.org/10.1007/978-3-030-15612-1.

MLA (8th ed.) Citation

SpringerLink (Online service) and Umberto Celano. Electrical Atomic Force Microscopy for Nanoelectronics. 1st ed. 2019. Springer International Publishing : Imprint: Springer, 2019. https://doi.org/10.1007/978-3-030-15612-1.