Tan, S., Tahoori, M., Kim, T., Wang, S., Sun, Z., & Kiamehr, S. (2019). Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization (1st ed. 2019.). Springer International Publishing : Imprint: Springer. https://doi.org/10.1007/978-3-030-26172-6
Παραπομπή σε μορφή Chicago (17η εκδ.)Tan, Sheldon, Mehdi Tahoori, Taeyoung Kim, Shengcheng Wang, Zeyu Sun, και Saman Kiamehr. Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization. 1st ed. 2019. Cham: Springer International Publishing : Imprint: Springer, 2019. https://doi.org/10.1007/978-3-030-26172-6.
Παραπομπή σε μορφή MLA (8th εκδ.)Tan, Sheldon, et al. Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization. 1st ed. 2019. Springer International Publishing : Imprint: Springer, 2019. https://doi.org/10.1007/978-3-030-26172-6.
