A Practical Guide to Surface Metrology

• Κύριος συγγραφέας: Quinten, Michael (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2019.
• Έκδοση: 1st ed. 2019.
• Σειρά: Springer Series in Measurement Science and Technology,
• Θέματα: Physical measurements.; Measurement .; Materials science.; Surfaces (Physics).; Interfaces (Physical sciences).; Thin films.; Materials-Surfaces.; Engineering-Materials.; Lasers.; Photonics.; Measurement Science and Instrumentation.; Characterization and Evaluation of Materials.; Surface and Interface Science, Thin Films.; Surfaces and Interfaces, Thin Films.; Materials Engineering.; Optics, Lasers, Photonics, Optical Devices.

This book offers a genuinely practical introduction to the most commonly encountered optical and non-optical systems used for the metrology and characterization of surfaces, including guidance on best practice, calibration, advantages and disadvantages, and interpretation of results. It enables the...

Πίνακας περιεχομένων:

• Preface
• Introduction to Surfaces and Surface Metrology
• Tactile Surface Metrology
• Capacitive And Inductive Surface Metrology
• Optical Surface Metrology- Physical Basics
• Optical Surface Metrology - Methods
• Imaging Methods - Multisensor - Systems - A Versatile Approach To Surface Metrology
• Appendix
• Index.