Noncontact Atomic Force Microscopy Volume 3 /

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Morita, Seizo (Επιμελητής έκδοσης), Giessibl, Franz J. (Επιμελητής έκδοσης), Meyer, Ernst (Επιμελητής έκδοσης), Wiesendanger, Roland (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2015.
• Σειρά: NanoScience and Technology,
• Θέματα: Physics.; Nanoscale science.; Nanoscience.; Nanostructures.; Spectroscopy.; Microscopy.; Nanotechnology.; Materials > Surfaces.; Thin films.; Nanoscale Science and Technology.; Surfaces and Interfaces, Thin Films.; Spectroscopy and Microscopy.

This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applica...

Πίνακας περιεχομένων:

• From the Contents: Introduction
• 3D Force-Field Spectroscopy
• Simultaneous NC-AFM/STM Measurements of Atomic-Sized Contacts
• Spectroscopy and Manipulation Using AFM/STM at Room Temperature
• The Phantom Force - The Influence of a Tunnel Current on Force Microscopy
• Non-Contact Friction
• Magnetic Exchange Force Spectroscopy.