Noncontact Atomic Force Microscopy Volume 3 /

• Corporate Author: SpringerLink (Online service)
• Other Authors: Morita, Seizo (Editor), Giessibl, Franz J. (Editor), Meyer, Ernst (Editor), Wiesendanger, Roland (Editor)
• Format: Electronic eBook
• Language: English
• Published: Cham : Springer International Publishing : Imprint: Springer, 2015.
• Series: NanoScience and Technology,
• Subjects: Physics.; Nanoscale science.; Nanoscience.; Nanostructures.; Spectroscopy.; Microscopy.; Nanotechnology.; Materials > Surfaces.; Thin films.; Nanoscale Science and Technology.; Surfaces and Interfaces, Thin Films.; Spectroscopy and Microscopy.

This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applica...

Table of Contents:

• From the Contents: Introduction
• 3D Force-Field Spectroscopy
• Simultaneous NC-AFM/STM Measurements of Atomic-Sized Contacts
• Spectroscopy and Manipulation Using AFM/STM at Room Temperature
• The Phantom Force - The Influence of a Tunnel Current on Force Microscopy
• Non-Contact Friction
• Magnetic Exchange Force Spectroscopy.