Everything You Wanted to Know About Data Analysis and Fitting but Were Afraid to Ask

• Κύριος συγγραφέας: Young, Peter (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2015.
• Σειρά: SpringerBriefs in Physics,
• Θέματα: Physics.; Physical measurements.; Measurement.; Statistics.; Measurement Science and Instrumentation.; Statistics for Engineering, Physics, Computer Science, Chemistry and Earth Sciences.; Numerical and Computational Physics.

These notes describe how to average and fit numerical data that have been obtained either by simulation or measurement. Following an introduction on how to estimate various average values, they discuss how to determine error bars on those estimates, and how to proceed for combinations of measured va...