Metrology and Physical Mechanisms in New Generation Ionic Devices

Metrology and Physical Mechanisms in New Generation Ionic Devices

The thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author ach...

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Bibliographic Details
Main Author: Celano, Umberto (Author)
Corporate Author: SpringerLink (Online service)
Format: Electronic eBook
Language:English
Published: Cham : Springer International Publishing : Imprint: Springer, 2016.
Series:Springer Theses, Recognizing Outstanding Ph.D. Research,
Subjects:
Physics.
Spectroscopy.
Microscopy.
Nanotechnology.
Materials science.
Spectroscopy and Microscopy.
Nanotechnology and Microengineering.
Characterization and Evaluation of Materials.
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ΒΚΠ - Πατρα: ALFd

Holdings details from ΒΚΠ - Πατρα: ALFd
Call Number: 330.01 BAU
Copy 1 Available

ΒΚΠ - Πατρα: BSC

Holdings details from ΒΚΠ - Πατρα: BSC
Call Number: 330.01 BAU
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