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02584nam a22005175i 4500 |
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978-3-319-39531-9 |
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DE-He213 |
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20160618105241.0 |
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cr nn 008mamaa |
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160618s2016 gw | s |||| 0|eng d |
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|a 9783319395319
|9 978-3-319-39531-9
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|a 10.1007/978-3-319-39531-9
|2 doi
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|a 621.36
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|a Celano, Umberto.
|e author.
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|a Metrology and Physical Mechanisms in New Generation Ionic Devices
|h [electronic resource] /
|c by Umberto Celano.
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|a Cham :
|b Springer International Publishing :
|b Imprint: Springer,
|c 2016.
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|a XXIV, 175 p. 96 illus., 18 illus. in color.
|b online resource.
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|a text
|b txt
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|a computer
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|a online resource
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|a text file
|b PDF
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|a Springer Theses, Recognizing Outstanding Ph.D. Research,
|x 2190-5053
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|a Introduction -- Filamentary-Based Resistive Switching -- Nanoscaled Electrical Characterization -- Conductive Filaments: Formation, Observation and Manipulation -- Three-Dimensional Filament Observation -- Reliability Threats in CBRAM -- Conclusions and Outlook. .
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|a The thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed. .
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|a Physics.
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|a Spectroscopy.
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|a Microscopy.
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|a Nanotechnology.
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|a Materials science.
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|a Physics.
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|a Spectroscopy and Microscopy.
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|a Nanotechnology and Microengineering.
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|a Characterization and Evaluation of Materials.
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| 710 |
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|a SpringerLink (Online service)
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|t Springer eBooks
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|i Printed edition:
|z 9783319395302
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|a Springer Theses, Recognizing Outstanding Ph.D. Research,
|x 2190-5053
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|u http://dx.doi.org/10.1007/978-3-319-39531-9
|z Full Text via HEAL-Link
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|a ZDB-2-PHA
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|a Physics and Astronomy (Springer-11651)
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