Metrology and Physical Mechanisms in New Generation Ionic Devices

• Main Author: Celano, Umberto (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic eBook
• Language: English
• Published: Cham : Springer International Publishing : Imprint: Springer, 2016.
• Series: Springer Theses, Recognizing Outstanding Ph.D. Research,
• Subjects: Physics.; Spectroscopy.; Microscopy.; Nanotechnology.; Materials science.; Spectroscopy and Microscopy.; Nanotechnology and Microengineering.; Characterization and Evaluation of Materials.

The thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author ach...

Table of Contents:

• Introduction
• Filamentary-Based Resistive Switching
• Nanoscaled Electrical Characterization
• Conductive Filaments: Formation, Observation and Manipulation
• Three-Dimensional Filament Observation
• Reliability Threats in CBRAM
• Conclusions and Outlook. .