Metrology and Physical Mechanisms in New Generation Ionic Devices

• Κύριος συγγραφέας: Celano, Umberto (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2016.
• Σειρά: Springer Theses, Recognizing Outstanding Ph.D. Research,
• Θέματα: Physics.; Spectroscopy.; Microscopy.; Nanotechnology.; Materials science.; Spectroscopy and Microscopy.; Nanotechnology and Microengineering.; Characterization and Evaluation of Materials.

The thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author ach...

Πίνακας περιεχομένων:

• Introduction
• Filamentary-Based Resistive Switching
• Nanoscaled Electrical Characterization
• Conductive Filaments: Formation, Observation and Manipulation
• Three-Dimensional Filament Observation
• Reliability Threats in CBRAM
• Conclusions and Outlook. .