Borja, J. P., Lu, T., & Plawsky, J. (2016). Dielectric Breakdown in Gigascale Electronics: Time Dependent Failure Mechanisms. Springer International Publishing : Imprint: Springer.
Chicago Style (17th ed.) CitationBorja, Juan Pablo, Toh-Ming Lu, and Joel Plawsky. Dielectric Breakdown in Gigascale Electronics: Time Dependent Failure Mechanisms. Cham: Springer International Publishing : Imprint: Springer, 2016.
MLA (8th ed.) CitationBorja, Juan Pablo, et al. Dielectric Breakdown in Gigascale Electronics: Time Dependent Failure Mechanisms. Springer International Publishing : Imprint: Springer, 2016.
Warning: These citations may not always be 100% accurate.
