Παραπομπή σε μορφή APA (7η εκδ.)

Borja, J. P., Lu, T., & Plawsky, J. (2016). Dielectric Breakdown in Gigascale Electronics: Time Dependent Failure Mechanisms. Springer International Publishing : Imprint: Springer.

Παραπομπή σε μορφή Chicago (17η εκδ.)

Borja, Juan Pablo, Toh-Ming Lu, και Joel Plawsky. Dielectric Breakdown in Gigascale Electronics: Time Dependent Failure Mechanisms. Cham: Springer International Publishing : Imprint: Springer, 2016.

Παραπομπή σε μορφή MLA (8th εκδ.)

Borja, Juan Pablo, et al. Dielectric Breakdown in Gigascale Electronics: Time Dependent Failure Mechanisms. Springer International Publishing : Imprint: Springer, 2016.