Dielectric Breakdown in Gigascale Electronics Time Dependent Failure Mechanisms /
This book focuses on the experimental and theoretical aspects of the time-dependent breakdown of advanced dielectric films used in gigascale electronics. Coverage includes the most important failure mechanisms for thin low-k films, new and established experimental techniques, recent advances in the...
Κύριοι συγγραφείς: | Borja, Juan Pablo (Συγγραφέας), Lu, Toh-Ming (Συγγραφέας), Plawsky, Joel (Συγγραφέας) |
---|---|
Συγγραφή απο Οργανισμό/Αρχή: | SpringerLink (Online service) |
Μορφή: | Ηλεκτρονική πηγή Ηλ. βιβλίο |
Γλώσσα: | English |
Έκδοση: |
Cham :
Springer International Publishing : Imprint: Springer,
2016.
|
Σειρά: | SpringerBriefs in Materials,
|
Θέματα: | |
Διαθέσιμο Online: | Full Text via HEAL-Link |
Παρόμοια τεκμήρια
-
Functional Nanomaterials and Devices for Electronics, Sensors and Energy Harvesting
Έκδοση: (2014) -
Metal-Dielectric Interfaces in Gigascale Electronics Thermal and Electrical Stability /
ανά: He, Ming, κ.ά.
Έκδοση: (2012) -
Piezotronics and Piezo-Phototronics
ανά: Wang, Zhong Lin
Έκδοση: (2012) -
Carbon Nanotube Based VLSI Interconnects Analysis and Design /
ανά: Kaushik, Brajesh Kumar, κ.ά.
Έκδοση: (2015) -
Field Emission Electronics
ανά: Egorov, Nikolay, κ.ά.
Έκδοση: (2017)