Dielectric Breakdown in Gigascale Electronics Time Dependent Failure Mechanisms /

• Κύριοι συγγραφείς: Borja, Juan Pablo (Συγγραφέας), Lu, Toh-Ming (Συγγραφέας), Plawsky, Joel (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2016.
• Σειρά: SpringerBriefs in Materials,
• Θέματα: Materials science.; Electronic circuits.; Nanotechnology.; Optical materials.; Electronic materials.; Materials Science.; Optical and Electronic Materials.; Nanotechnology and Microengineering.; Electronic Circuits and Devices.

This book focuses on the experimental and theoretical aspects of the time-dependent breakdown of advanced dielectric films used in gigascale electronics. Coverage includes the most important failure mechanisms for thin low-k films, new and established experimental techniques, recent advances in the...

Πίνακας περιεχομένων:

• Introduction
• General Theories
• Measurement Tools and Test Structures
• Experimental Techniques
• Breakdown Experiments
• Kinetics of Charge Carrier Confinement in Thin Dielectrics
• Theory of Dielectric Breakdown in Nanoporous Thin Films
• Dielectric Breakdown in Copper Interconnects
• Reconsidering Conventional Models.