Quantum Metrology, Imaging, and Communication

• Κύριοι συγγραφείς: Simon, David S. (Συγγραφέας), Jaeger, Gregg (Συγγραφέας), Sergienko, Alexander V. (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2017.
• Σειρά: Quantum Science and Technology,
• Θέματα: Physics.; Quantum physics.; Quantum optics.; Quantum computers.; Spintronics.; Quantum Optics.; Quantum Information Technology, Spintronics.; Quantum Physics.

This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by referen...