Quantum Metrology, Imaging, and Communication

• Κύριοι συγγραφείς: Simon, David S. (Συγγραφέας), Jaeger, Gregg (Συγγραφέας), Sergienko, Alexander V. (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2017.
• Σειρά: Quantum Science and Technology,
• Θέματα: Physics.; Quantum physics.; Quantum optics.; Quantum computers.; Spintronics.; Quantum Optics.; Quantum Information Technology, Spintronics.; Quantum Physics.

This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by referen...

Πίνακας περιεχομένων:

• Quantum Optics and Entanglement
• Two-Photon Interference- Aberration and Dispersion Cancelation
• Quantum Metrology
• Polarization Mode Dispersion
• Ghost Imaging and Related Topics
• Quantum Microscopy
• Correlated and Entangled Orbital Angular Momentum
• Quantum Communication and Cryptography
• Appendices A: Review of Optics
• B: Optical Fields in Quantum Mechanics
• C: Optical Effects of Aberration and Turbulence
• D: Phase Matching in Spontaneous Parametric Down Conversion
• E: Vectorial Scattering Analysis of the Twin-Photon Microscope.