Timing Performance of Nanometer Digital Circuits Under Process Variations

• Main Authors: Champac, Victor (Author, http://id.loc.gov/vocabulary/relators/aut), Garcia Gervacio, Jose (http://id.loc.gov/vocabulary/relators/aut)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic eBook
• Language: English
• Published: Cham : Springer International Publishing : Imprint: Springer, 2018.
• Edition: 1st ed. 2018.
• Series: Frontiers in Electronic Testing, 39
• Subjects: Electronic circuits.; Microprocessors.; Electronics.; Microelectronics.; Circuits and Systems.; Processor Architectures.; Electronics and Microelectronics, Instrumentation.

This book discusses the digital design of integrated circuits under process variations, with a focus on design-time solutions. The authors describe a step-by-step methodology, going from logic gates to logic paths to the circuit level. Topics are presented in comprehensively, without overwhelming us...

Table of Contents:

• Introduction
• Mathematical Fundamentals
• Process Variations
• Gate delay under process variations
• Path Delay Under Process Variations
• Circuit Analysis under Process Variations
• FinFET Technology and design issues.